Editing Diagnostic Serial Console (section)

=== Manual Memory Testing Command Sequences ===

Pattern testing algorithms include Walking Ones Tests using the 32-bit sequence 0x00000001, 0x00000002, 0x00000004, 0x00000008, continuing through all 32 bit positions to 0x40000000, 0x80000000, designed to detect stuck address bits and adjacent bit interference. Walking Zeros Tests employ the inverse pattern sequence 0xFFFFFFFE, 0xFFFFFFFD, 0xFFFFFFFB, 0xFFFFFFF7, continuing through all inverse positions to 0xBFFFFFFF, 0x7FFFFFFF, identifying stuck-at-one faults and coupling issues.

The March C- Algorithm implementation follows these steps: initialize all memory locations with 0s, read 0 and write 1 in ascending address order, read 1 and write 0 in ascending address order, read 0 and write 1 in descending address order, read 1 and write 0 in descending address order, and conclude with read 0 verification pass in descending addresses. This comprehensive algorithm detects various memory cell failure modes including data retention, coupling effects, and address decode problems.